Experimental Data on Test Escapes Table of Contents
نویسندگان
چکیده
Defective chips may pass structural tests applied via scan chains (also called test escapes). We conducted many experiments on test chips fabricated in three different technologies (0.13μm, 0.18μm, and 0.35μm) to understand the extent of the number of test escapes and to develop techniques that minimize the number of test escapes. This paper presents the test chips, the setup of the experiments, the experimental data collected, and the results of analyzing the data.
منابع مشابه
Comparing the Effect of Exposure and Response Prevention and Paradoxical Time Table Therapy Techniques on the Obsessive-Compulsive Disorder Patients
Aims Obsessive-compulsive Disorder (OCD) is one of the most common psychiatric disorders. Almost about five million Americans are identified with OCD every year. The purpose of this study was to compare the effectiveness of the Exposure and Response Prevention (ERP) and paradoxical time table therapy technique on OCD patients. Methods & Materials This experimental study was an extension of th...
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تاریخ انتشار 2004